摘要
本文重点研究晶振的测试方法及优化晶振电路的设计方案。利用稳定的测试系统采集波形,正确的分析方法判别风险,合理的设计方案优化电路,最终解决了模块提前启动或者不启动的异常,同时提升了IGCT控制模块的可靠性和稳定性。
This paper focuses on the testing methods of crystal oscillators and the design scheme of optimizing crystal oscillator circuits.The stable test system is used to collect waveforms,the correct analysis method is used to identify risks,and a reasonable design plan is used to optimize the circuit.Finally,the abnormality of early startup or non startup of the module is solved,and the reliability and stability of the IGCT control module are improved.
作者
张文发
陈春
罗坚
张涛
张艳辉
Zhang Wenfa;Chen Chun;Luo Jian;Zhang Tao;Zhang Yanhui
出处
《印制电路资讯》
2023年第3期89-94,共6页
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