摘要
Scanning probe microscopy(SPM)allows the spatial imaging,measurement,and manipulation of nano and atomic scale surfaces in real space.In the last two decades,numerous advanced and functional SPM methods,particularly atomic force microscopy(AFM),have been developed and applied in various research fields,from mapping sample morphology to measuring physical properties.Herein,we review the recent progress in functional AFM methods and their applications in studies of two-dimensional(2D)materials,particularly their interfacial physical properties on the substrates.This review can inspire more exciting application works using advanced AFM modes in the 2D and functional materials fields.
基金
supported by the National Natural Science Foundation of China(NSFC)(Nos.61911540074,61674045,11604063,11622437,11974422,and 12172047)
the Ministry of Science and Technology(MOST)of China(Nos.2016YFA0200700 and 2018YFE0202700)
the support of the Strategic Priority Research Program of the Chinese Academy of Sciences(CAS)(No.XDB30000000)
Z H C and W J received Fundamental Research Funds for the Central Universities and Research Funds of Renmin University of China(Nos.21XNLG27 and 19XNQ025).
