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Chip-scale metalens microscope for wide-field and depth-of-field imaging 被引量:6

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摘要 Microscopy is very important in research and industry,yet traditional optical microscopy suffers from the limited field-of-view(FOV)and depth-of-field(DOF)in high-resolution imaging.We demonstrate a simultaneous large FOV and DOF microscope imaging technology based on a chip-scale metalens device that is implemented by a SiNxmetalens array with a co-and cross-polarization multiplexed dual-phase design and dispersive spectrum zoom effect.A 4-mm×4-mm FOV is obtained with a resolution of 1.74μm and DOF of200μm within a wavelength range of 450 to 510 nm,which definitely exceeds the performance of traditional microscopes with the same resolution.Moreover,it is realized in a miniaturized compact prototype,showing an overall advantage for portable and convenient microscope technology.
出处 《Advanced Photonics》 SCIE EI CAS CSCD 2022年第4期68-75,共8页 先进光子学(英文)
基金 financial support from the National Key R&D Program of China(2017YFA0303701) the National Natural Science Foundation of China(91850204 and 12174186) support from the Dengfeng Project B of Nanjing University。
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