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国产化背景下车规级芯片环境可靠性试验标准研究 被引量:4

Research on Environmental Reliability Test Standards of Automotive-grade Chips under the Background of Localization
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摘要 随着汽车芯片短缺情况持续加剧,2021年全球汽车总计减产810.7万辆,因疫情“黑天鹅”因素及芯片产业自身的长周期性,汽车芯片短缺问题在短时间内难以消除。在“新四化”浪潮下,汽车产业的芯片需求会进一步扩大,汽车芯片短缺将进一步加剧。车规级芯片技术突破与产业化发展成为根本的解决办法,本文从现有汽车电子产品的环境可靠性试验标准与国外的相应标准两个方向进行对比研究,为国产化下的车规级芯片环境可靠性试验体系建设提供借鉴。 As the shortage of automotive chips continues to intensify,a total of 8.107 million vehicles cut globally in 2021.Due to the"black swan"factor of the COVID-19 and the long-term cycle of the chip industry,the shortage of automotive chips is diffi cult to eliminate in a short period of time.Under the wave of the"new four modernizations",the demand for chips in the automotive industry will further expand,and the shortage of automotive chips will further intensify.The technological breakthrough and industrialization development of automotive-grade chips have become the fundamental solutions.This paper conducts a comparative study between the existing environmental reliability test standards of automotive electronic products and the corresponding foreign standards.Provide reference for the construction of chip reliability test system.
作者 张送 胡慧婧 韦锦波 何逸波 Zhang Song;Hu Huijing;Wei Jinbo;He Yibo
出处 《时代汽车》 2022年第10期4-6,共3页 Auto Time
基金 柳州市科技计划资助项目(2021AAA0101)。
关键词 车规级 芯片国产化 可靠性试验 试验标准 Vehicle Regulation Level Chip Localization Reliability Test Test Standard
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