摘要
Carbon nanotubes(CNTs)can be used as atomic force microscopy(AFM)tips for high-resolution scanning due to their small diameter,high aspect ratio and outstanding wear resistance.However,previous approaches for fabricating CNT probes are complex and poorly controlled.In this paper,we introduce a simple method to selectively fabricate a single CNT on an AFM tip by controlling the trigger threshold to adjust the amount of growth solution attached to the tip.The yield rate is over 93%.The resulting CNT probes are suitable in length,without the need for a subsequent cutting process.We used the CNT probe to scan the complex nanostructure with a high aspect ratio,thereby solving the long-lasting problem of mapping complex nanostructures.
基金
the Program for Science and Technology Innovation Group of Shaanxi Province(2019TD-011)
the Key Research and Development Program of Shaanxi Province(2020ZDLGY04-02)
the Fundamental Research Funds for the Central Universities.
