摘要
搭建试验地网研究土壤中金属导体对接地电阻的影响。通过埋设不同形状金属导体,改变金属导体埋设深度、与试验地网相对距离,在不同点位测量试验地网接地电阻值。分析试验数据发现,埋地金属导体导致接地电阻测量值偏小,其中环形金属导体对接地电阻测量值影响最大,一形金属导体对接地电阻测量值影响最小;金属导体位于测试电压极外侧相比位于内侧时,对接地电阻测量值的影响更大;金属导体位于测试电压极内侧时,不同测试点位接地电阻测量值差异较大,金属导体位于测试电压极外侧时,各点位接地电阻测量值差异不大;金属导体埋设深度对接地电阻测量值影响不明显。
The influence of a metal conductor in soil on ground resistance is studied by setting up the experimental ground grid.By embedding different shape metal conductors,changing the buried depth of metal conductors and the relative distance from the test grounding grid,the grounding resistance of the test grounding grid was measured at different points.Analysis of test data shows that the buried metal conductor leads to the smaller measured value of grounding resistance,among which the sguare-shaped metal conductor has the greatest influence on the measured value of grounding resistance,and the lineshaped metal conductor has the least influence on the measured value.When the metal conductor is located outside the test voltage pole,the influence on the measured value of grounding resistance is greater than that on the inside.When the metal conductor is located inside the test voltage pole,the measured value of grounding resistance at different test points is quite different.When the metal conductor is located outside the test voltage pole,the measured value of grounding resistance at each point has little difference.The buried depth of a metal conductor has no obvious influence on the measured value of grounding resistance.
作者
覃彬全
郭在华
陈佳祺
吴刚
糜翔
QIN Binquan;GUO Zaihua;CHENG Jiaqi;WU Gang;MI Xiang(Chongqing Meteorological Disaster Prevention Technology Center,Chongqing 401147;Chengdu University of Information Technology,Chengdu 610225;Key Laboratory of Atmospheric Sounding,Chengdu 610225;Shapingba District Meteorological Service,Chongqing 401147)
出处
《气象科技》
2021年第4期662-670,共9页
Meteorological Science and Technology
基金
重庆市技术创新与应用示范项目“爆炸危险场所雷电防护关键技术研究”(项目编号:cstc2018jscx)
重庆市气象局开放式研究基金项目“复杂地质条件下雷电流入地散流机理和腐蚀效应研究”(项目编号:kfjj-201401)资助。
关键词
埋地金属导体
接地电阻
测试影响
buried metal conductor
grounding resistance
test influence
