摘要
该文首先介绍了GUM和MCM的适用范围,指出GUM的局限性和使用中的常见错误。采用MCM对所设计的标准微带传输线的归一化电场强度进行了不确定度分析,详细描述MCM分析步骤,给出最终结果。归一化场强数学期望值为24.45 V/m,扩展不确定度U95=0.28 dB,满足作为近场扫描仪的计量标准器的要求。
This paper first introduces the application scope of GUM and MCM,and points out the limitations of GUM and common errors in use.The uncertainty of the normalized electric field intensity of the designed standard micro-strip transmission line is analyzed by MCM.The analysis steps of MCM are described in detail,and the final results are given.The mathematical expectation of normalized field strength is 24.45 V/m,and the expanded uncertainty U95=0.28 dB.The micro-strip transmission line can meet the requirements of the measurement standard of near-field scanner.
作者
林树坚
段莉莉
Lin Shu-jian;Duan Li-li(Guangdong Zhuoshi product quality technical service Co.,Ltd,Guangdong Guangzhou 510507)
出处
《电子质量》
2021年第8期120-123,共4页
Electronics Quality
关键词
测量不确定度
GUM
MCM
微带传输线
近场扫描仪
Measurement uncertainty
GUM
MCM
Micro-strip transmission line
Near field scanner
