摘要
Nanocrystalline grain Ag-MgF_(2) cermet films were prepared by using sintered-in-vacuum Ag-MgF_(2) mixture granules as evaporant.The microstructure and the electronic energy states of the films were examined by x-ray diffraction,transmission electron microscopy,electron diffraction and x-ray photoelectron spectroscopy.The results showed that obtained Ag-MgF_(2) cermet films consist of mainly amorphous MgF_(2) matrix with embedded fcc-Ag nanocrystalline grains.The principal x-ray diffraction peaks at d=3.4245,2.6102,and 2.0503 A are probably related to Ag-MgF_(2) cermet composite structure.
基金
Supported by the Natural Science Foundation of Anhui Province,China.
