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A Metal Oxide Heterostructure for Resistive Random Access Memory Devices

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摘要 We propose and investigate a metal oxide heterostructure(MOH)based resistive switching(RS)device.The driving mechanism of resistive switching(RS)in an MOH is more directly related to oxygen ion/vacancy migration around their interface.The performance of an MOH-based RS device depends on the oxygen mobility,oxygen vacancy concentration as well as its relation to the resistivity.An enhanced ratio of high resistance state to low resistance state can be achieved if the two involved metal oxides are mutually complemental metal oxides in which one of them has larger resistivity with increasing concentration of vacancy while the other one is the reverse.
作者 LIAO Zhao-Liang CHEN Dong-Min 廖昭亮;陈东敏(Department of Physics and Astronomy,Louisianan State University,Baton Rouge,LA 70810,USA;Academy for Advanced Interdisciplinary Studies,Peking University,Beijing 100871)
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2013年第4期197-200,共4页 中国物理快报(英文版)
基金 the Chinese Academy of Sciences(No KJCX2-SW-W26) the National Natural Science Foundation of China under Grant No 90406017 U.S.DOE under Grant No DOE DE-SC0002136.
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