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电子束辐照对过热保护元件的电性能影响

Effect of Electron Beam Irradiation on Electrical Properties of Overheat Protection Device
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摘要 制备了含氟树脂/炭黑复合体系为正温度系数(PTC)效应功能层的过热保护元件,考察了电子束辐照对其室温电阻、电阻-温度(RT)特性、耐电压等级、10 000次动作耐久可靠性及耐环境可靠性的影响。结果表明:电子束辐照不影响过热保护元件的电渗流行为;当炭黑质量分数相同时,随着电子束辐照剂量的增加,过热保护元件的电阻呈现先降低再升高的特征;相同电阻水平的过热保护元件,电子束辐照剂量越高,RT转折温度越低,RT强度越高,并且在高温高阻区间RT呈现出特殊的翘尾现象;电子束辐照能够增加复合体系中导电网络的稳定性,同时对复合体系的结合界面又存在破坏作用;当辐照剂量为120~160 kGy时,过热保护元件兼具有较理想的耐电压等级、10 000次动作耐久可靠性和耐环境可靠性。 An overheat protection device with positive temperature coefficient(PTC) effect functional layer of fluorine-containing resin/carbon black composite system is prepared, and the effects of electron beam irradiation on its room temperature resistance, resistance-temperature(RT) characteristics, voltage class, 10 000 trip cycles durability, reliability and environmental reliability are investigated. The results show that electron beam irradiation does not affect the electrical percolation behavior of the overheating protection element when the content of carbon black is the same. With the increase of electron beam irradiation dose, the resistance of the overheat protection device first decreases and then increases. For the overheat protection device with the same resistance level, the higher the electron beam irradiation dose is, the lower the RT transition temperature is, and the higher the RT intensity is. And the RT shows the carryover effect in the high temperature and high resistance range. Electron beam irradiation can increase the stability of the conductive network in the composite system, and damage the interface of the composite system at the same time. When the irradiation dose is 120~160 kGy, the overheat protection device has ideal voltage class, 10 000 trip cycles durability and environment adaption reliability.
作者 曹清华 刘利锋 郁益根 CAO Qinghua;LIU Lifeng;YU Yigen(Wayon Electronics Co.,Ltd.,Shanghai 201207,China)
出处 《仪表技术》 2021年第3期28-32,共5页 Instrumentation Technology
关键词 含氟树脂/炭黑复合体系 正温度系数效应 过热保护元件 可靠性 fluorine-containing resin/carbon black composite system positive temperature coefficient effect overheat protection device reliability
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