摘要
芯片测试是防止缺陷或故障芯片流入市场的有效手段。在测试应用中,将大规模测试向量通过芯片引脚传输到片上系统。在有限芯片引脚下,测试应用时间主要取决于测试向量传输时间。编码压缩在不提供被测电路信息条件下减少测试向量传输时间,同时节约测试向量存储空间,因而被广泛应用于压缩由测试向量组成的测试集,然而编码压缩未能充分挖掘测试集特征,导致编码压缩效果不佳。针对该问题,提出一种基于测试集主成分的变换-拆分方法,使主流编码压缩效果显著。该方法首先提取能代表测试集特征的主成分,然后利用这些主成分作为向量构造出一个矩阵。该矩阵与位流经过数学中的矩阵变换即可将测试集拆分成主分量集和残差集。相比原测试集,残差集有更好的可压缩性,而主分量集可片上压缩,不占用传输时间。对ISCAS’89部分标准电路的实验结果表明,该方法下的最高平均压缩率达到80.53%,与最先进的变换-拆分法相比,不同编码下的平均压缩率都有提高,且最大提高幅度为5.27%。
Chip testing is an effective method to prevent defective or faulty chips from reaching the market.During test application,large-scale test patterns are transmitted to a system-on-chip through chip pins.Test application time mainly depends on the transmission time with the limited chip pins.Code-based compressions can reduce the transmission time with no information for the circuit under test,and save storage space for test patterns.Therefore,it is widely applied to compress the test set composed of test patterns.However,code-based compressions fail to fully exploit the characteristics of the test set,resulting in poor compression efficiency.To solve this problem,this study proposes a transform-decomposing method based on significant components of the test set,which makes the current coding compression effect significant.First,extract the significant components that best represent the characteristics of the test set,and then use them as vectors to construct a matrix.Via performing matrix transform in mathematics between the matrix and the test set,the test set can be decomposed into a primary component set(PCS)and a residual component set(RCS).Compared with the original test set,the RCS has better compressibility.As the PCS can be generated on-chip,it does not occupy the transmission time.The experimental results on ISCAS'89 benchmark circuits show that the highest compression ratio for the proposed method reaches 80.53%on average.Compared with the state-of-the-art transform-composing method,the average compression ratios for different code-based compressions are increased,and that for the most improved code-based compression is increased by 5.27%.
作者
张明和
夏泽
邝继顺
Zhang Minghe;Xia Ze;Kuang Jishun(College of Information Science and Engineering,Hunan University,Changsha 410082,China)
出处
《电子测量与仪器学报》
CSCD
北大核心
2020年第9期94-100,共7页
Journal of Electronic Measurement and Instrumentation
基金
国家自然科学基金(61472123,61902118)
中国博士后科学基金(2019M662771)资助项目。
关键词
测试应用时间
测试向量
编码压缩
变换-拆分
test application time
test pattern
code-based compression
transform-decomposing
