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芯片音频参数智能测试方案设计与实现 被引量:1

Design and Implementation of Intelligent Test Scheme for Chip Audio Parameters
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摘要 随着市场对语音电子产品性能指标的高标准严要求,提高语音电子产品的性能指标已经引起芯片生产商的高度重视。针对信噪比(SNR)与总谐波失真加噪声(THD+N)等音频参数使用专业仪器测试成本高、速度慢及连接复杂等种种弊端,文章提出了一套芯片音频参数测试方案,并通过样机实验数据对比,验证了该方案具有性价比高、速度快、操作简便等优点,测试的产品经过质检部门和客户的验证,达到了使用要求,从而为公司节省大批测试设备购置费用和维护成本。 With the market’s strict requirements on the performance indicators of voice electronic products,improving the performance indicators of voice electronic products become first priority for most of semiconductor manufacturers.Focus on signal-to-noise ratio(SNR)and total harmonic distortion plus noise(THD+N)using professional audio parameters,such as instrument testing high cost,slow speed and complex shortcomings such as connection,this paper puts forward a set of chip audio parameters testing solution,and through the prototype experiment data comparison,with the proposed method is validated through cost-effective,quick speed,sampling operation,testing of the product after the quality department and customer validation,reach the customer requirement,so as to save a large number of test equipment for the company to purchase cost and maintenance cost.
作者 黄美莲 HUANG Meilian
出处 《数字通信世界》 2020年第10期86-87,248,共3页 Digital Communication World
关键词 芯片 音频参数 SNR THD+N 智能 测试方案 chip audio parameters SNR THD+N intelligence test scheme
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