摘要
片式电阻结构和功能相对简单,在航天产品上使用广泛,国产化率也高,但是对于一些高精度和低温度系数的电阻,其可靠性性水平还有待进一步提高。结构分析作为一种新的评价元器件设计、结构、材料和工艺可靠性技术,在设计阶段介入可以及时发现影响电阻性能和可靠性的因素。论文以国产军用片式电阻为对象开展了结构分析,结果表明端电极中的阻挡层未延伸至保护膜上且与内电极之间存在缝隙,使用过程中内电极容易发生腐蚀,引起阻值异常甚至开路。
Chip resistors are relatively simple in structure and function,are widely used in aerospace products,and most of them are produced in China.However,for some resistors with high accuracy and low temperature coefficient,their reliability still needs to be further improved.Structural analysis,as a new technology for evaluating the reliability of design,structure,material and process,which can find out the factors affecting the resistance performance and reliability in time by intervening in the design stage.In this paper,the structure analysis of military chip resistance is carried out.The results show that the barrier layer in the end electrode does not extend to the protective film and there is a gap between the barrier layer and the inner electrode.The inner elec⁃trode is prone to corrosion during use,which results in abnormal resistance value.
作者
邝栗山
王坦
KUANG Lishan;WANG Tan(Aerospace Science and Industry Defense Technology Research Testing Center,Beijing 100854)
出处
《舰船电子工程》
2020年第9期176-178,共3页
Ship Electronic Engineering
关键词
片式电阻
结构分析
缝隙
腐蚀
chip resistor
structural analysis
gap
corrosion
