摘要
针对国产某型号高线性光电耦合器在实际使用中出现的输出电压下降的问题,通过建立故障树,并逐一排除失效点的办法,找出了器件的失效原因为调试电阻与导电胶的连接退化;分析了其失效机理,提出了相应的改进措施;通过试验对改进措施的有效性进行了验证,为后续的工艺与设计改进提供了数据与理论基础。
Aiming at the problem of the output voltage drop of a domestic optical isolation amplifier in actual use,by establishing a fault tree and eliminating the failure points one by one,the failure cause of the device is found to be that the connection between the debugging resistor and the conductive adhesive is degraded.The failure mechanism is analyzed,and the corresponding improvement measures are put forward,which provides data and theoretical basis for subsequent process and design improvements.
作者
吴琼瑶
WU Qiongyao(The 44th Research Institute of CETC,Chongqing 400060,China)
出处
《电子产品可靠性与环境试验》
2020年第S01期23-28,共6页
Electronic Product Reliability and Environmental Testing
关键词
输出电压
故障树
失效机理
导电胶
功能失效
output-voltage
fault tree
failure mechanism
conducting resin
function failure
