摘要
针对PCB集成化RFID标签天线设计中天线结构与标签性能之间的复杂关系,提出一种基于正交设计的标签天线优化设计。通过对PCB集成化RFID标签的回波损耗的仿真试验,经过方差分析得到标签天线各类结构变化对于试验指标影响的显著性,指导设计者找到设计指标主导因素并可获得最佳因素水平。试验结果表明该优化设计方法能够在帮助设计者提供设计方向的同时有效减小设计者的工作量,实用高效。
For the complex relationship between the antenna structure and tag performance,this paper presents the design of tag antenna based on the method of orthogonal design.By simulation test of return loss of PCB passive RFID tags,the significance of the various structural changes of the tag antenna for test indicators can be obtained after variance analysis.It can guide the designer to find the level of factors that dominate the design index and even meet the design index.Experiments prove that the design of tag antenna based on the method of orthogonal design can help designers to reduce the designer's workload while providing design direction.
作者
张慧磊
贺则昊
ZHANG Hui-lei;HE Ze-hao(College of Quality and Safety Engineering,China Jilian University)
出处
《中国标准化》
2020年第6期184-187,共4页
China Standardization
关键词
射频识别
天线结构
正交设计
方差分析
RFID
antenna structure
orthogonal design
variance analysis
