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N-PERT电池灰团异常原因及可靠性风险分析

Analysis of abnormal reasons and reliability risk of grey group in N-PERT cell
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摘要 针对N-PERT电池电致发光(EL)测试时出现的团状发灰现象进行分析,通过对异常区域与正常区域的外观、EL、绒面、膜厚折射率对比测试,结合量子效率和能量散射光谱(EDS)成分测试结果分析,认为灰团的主要原因是制绒反应过程中Na2SiO3附着在电池表面导致SiNx局部区域膜层较厚,以及Al2O3钝化膜生长不均导致氮化硅膜沉积不均。从可靠性风险方面分析灰团电池片的钝化层效果不良,在抗PID的性能方面风险较高。 The phenomenon of grey group in the N-pert cell EL test was analyzed.The appearance,EL,surface texture and film thickness refractive index of the abnormal area and the normal area were compared,and the results of quantum efficiency and EDS component test were analyzed.It is believed that the main reasons for the grey group are that Na2SiO3 attached to the cell surface in the reaction process of texturing leads to thick film in the local area of silicon nitride film,and uneven growth of Alumina film leads to uneven deposition of silicon nitride film.From the aspect of reliability risk,it is analyzed that the passivation layer of grey battery is not effective,and the PID performance is of high risk.
作者 姜倩 苗林 唐兰兰 李媛媛 张银环 JIANG Qian;MIAO Lin;TANG Lan-lan;LI Yuan-yuan;ZHANG Yin-huan(SPIC Xi'an Solar Power Co.,Ltd.,Xi'an Shaanxi 710100,China)
出处 《电源技术》 CAS 北大核心 2020年第5期702-705,共4页 Chinese Journal of Power Sources
关键词 N-PERT电池 灰团 氮化硅 三氧化二铝 钝化膜 可靠性 N-PERT cell grey group SiNx Al2O3 passivating film reliability
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