摘要
针对大规模芯片测试中对数据采集高精度、高速率、大容量的要求,文中提出了一种基于ARM的大容量并行通信数据处理系统设计方案。该系统以STM32F767作为主控芯片,六通道的AD7656芯片作为模拟数字(A/D)转换芯片,芯片间采用并行通信,实现了多个通道并行模数转换,通过扩展SDRAM,实现了大容量数据存储。文中介绍了硬件设计、工作原理以及软件编程的实现方法,最后以安捷伦B1500A半导体分析仪为参照,通过直流测试和交流测试验证了系统的测试精度和可靠性。结果证明,该系统可实现32MB的数据存储,经过校准后电压测试精度可以小于0.5mV,电流测试精度可以达到1μA。
Aiming at the requirements of high precision,high speed and large capacity of data acquisition system in large-scale chip testing,a design scheme of high capacity parallel communication data acquisition and processing system is proposed based on ARM architecture.The STM32 F767 is used as the main control chip,and six-channel AD7656 is used as the analog digital(A/D) conversion solution.Parallel communication between the chips is used to achieve parallel analog-to-digital conversion of multiple channels.The system realizes high capacity data storage by expanding SDRAM.The hardware construction,working principle and corresponding software implementation of the system is introduced in details.The acquisition and processing accuracy of the proposed system are verified by both DC and AC tests with a benchmark of semiconductor analyzer Agilent B1500 A’s results.The results show that the system can achieve 32 MB of data storage.The resolution of voltage of our system reaches 0.5 mV or even less,and the current’s accuracy reaches 1μA after calibration.
作者
刘亚楠
曹雨燕
孙晓霞
赵凯
朱嘉林
LIU Ya-nan;CAO Yu-yan;SUN Xiao-xia;ZHAO Kai;ZHU Jia-lin(School of Automation,Beijing Information Science&Technology University,Beijing 100192,China;School of Information&Commutation Engineering,Beijing Information Science&Technology University,Beijing 100101,China;School of Applied Science and Technology,China University of Labor Relations,Beijing 100048,China)
出处
《信息技术》
2020年第5期91-96,101,共7页
Information Technology
