摘要
由于测量系统的非线性响应,导致相机采集的光栅条纹不具有良好的正弦性,从而降低了相位计算精度。虽然双N步相移算法证明可以较大程度地减少相位误差,但需要增加1倍的投影条纹数量。为此,提出了一种相位误差自校正算法。该方法将原包裹相位变换后,得到类似于双N步相移法中的第2包裹相位,然后融合两包裹相位以达到减小相位误差的目的,所提算法无需额外附加投影条纹。为提高测量速度,对投影条纹离焦二值化,实现了高速三维测量。实验结果证明,相较于传统相移算法,所提算法的测量误差降低了34.2%,测量效率为传统相移算法的67.7倍;相较于现有的双N步相移算法,测量精度接近,但测量效率为双N步相移算法的141.8倍。
Due to the non-linear response of the measurement system, the grating fringes captured by the camera do not have good sinusoidal property, which reduces the phase calculation accuracy. Although the double N-step phase-shifting algorithm proves to reduce phase errors to a great extent, it needs to double the number of projected fringes. For this purpose, a phase error self-correction algorithm is proposed. After transforming the original wrapped phase, a second wrapped phase similar with that in the double N-step phase-shifting algorithm is obtained, then both wrapped phases are integrated to reduce phase error. The proposed algorithm does not need additional projection fringes. In order to improve the measurement speed, the projection fringe that defocusing binarization is used to realize high-speed three-dimensional measurement. The experimental results show that, compared with the traditional phase-shifting algorithm, the measurement error of the proposed algorithm is reduced by 34.2%, and the measurement efficiency is 67.7 times of that of the traditional phase-shifting algorithm. Compared with the existing double N-step phase-shifting algorithm, the measurement accuracy is close, but the measurement efficiency is 141.8 times of that of the double N-step phase-shifting algorithm.
作者
王建华
周玉国
杨延西
Wang Jianhua;Zhou Yuguo;Yang Yanxi(School of Information and Control Engineering,Qingdao University of Technology,Qingdao 266520,China;School of Automation and Information Engineering,Xi’an University of Technology,Xi’an 710048,China)
出处
《电子测量与仪器学报》
CSCD
北大核心
2019年第12期116-125,共10页
Journal of Electronic Measurement and Instrumentation
基金
国家自然科学基金(51275405)资助项目。
关键词
非线性响应
光栅条纹
相位误差自校正
高速三维测量
non-linear response
grating fringes
phase error self correction
high-speed three-dimensional measurement
