摘要
强电磁脉冲(高功率微波)武器作为新机理定向能武器,成为引信、火工品及制导系统等的最大威胁,越来越受到军事强国的高度关注。为明确引信壳体对强电磁脉冲的屏蔽效果及引信电子系统的干扰、损伤阈值,利用CST微波工作室对引信壳体防护效能进行仿真,并且以引信壳体及其电子系统为对象进行辐照试验。通过仿真分析和试验验证可知,仿真结果显示引信壳体对电场衰减为27.9 dB。试验结果显示电子系统在壳体防护下,电场强度小于45 kV/m时均能正常工作,在没有防护情况下,当强电磁脉冲电场强度峰值达15 kV/m时,芯片会产生重启复位,使引信起爆出现故障;当场强达50 kV/m时芯片有一定概率会被永久损坏。
The strong electromagnetic pulse(high-power microwave) weapons, as a new mechanism of directed energy weapons, have become the biggest threats of fuzes, pyrotechnics and guidance systems, and are receiving more and more attention from military powers. In order to clarify the shielding effect of the fuze casing on the strong electromagnetic pulse and the interference and damage threshold of the fuze electronic system, the CST microwave studio was used to simulate the fuze casing protection performance, and the fuze shell and its electronic system were irradiated. test. Simulation results showed that the fuse housing has an electric field attenuation of 27.9 dB. The test results showed that the electronic system could work normally under the protection of the shell and the electric field strength was less than 45 kV/m. In the absence of protection, when the peak intensity of the strong electromagnetic pulse electric field reached 15 kV/m, the chip would generate a reset reset, making the fuze detonation failed;the chip had a certain probability of being permanently damaged when the field strength reached 50 kV/m.
作者
郑福泉
娄文忠
杨金刚
冯恒振
ZHENG Fuquan;LOU Wenzhong;YANG Jingang;FENG Hengzhen(School of Mechatronical Engineering,Beijing Institute of Technology,Beijing 100081,China;Xi'an Institute of Mechanical and Information Technology,Xi'an 710065,China)
出处
《探测与控制学报》
CSCD
北大核心
2020年第1期21-24,28,共5页
Journal of Detection & Control
基金
国防科技重点实验室基金项目资助(201920201322)。
关键词
引信
强电磁脉冲
效应
评估
fuze
strong electromagnetic pulse
effect
evaluation
