摘要
主要分析了电力芯片电磁兼容的国内外发展现状及趋势,以及我国电力芯片电磁兼容性设计中面临的主要问题.结合电磁兼容相关理论,研究了电力芯片的电磁抗扰度和电磁干扰的测试方法及保护措施.重点论述了电力芯片在设计阶段减小电磁兼容性问题影响的3种设计方法.最后总结了电力芯片电磁兼容标准制定工作面临的挑战与展望.
This paper mainly studies the development status and trend of power chip at home and abroad,and analyzes the main problems in the EMC design of power chip in China. Based on the theory of EMC,the test methods and protection measures of electromagnetic immunity and electromagnetic interference of power chip are studied. This paper focuses on three design methods to reduce the influence of EMC in the design stage of power chip. Finally,the challenges and development of EMC standards for power chips are introduced.
作者
刘耀东
孙然
姜文超
刘轩
张赟
Liu Yaodong;Sun Ran;Jiang Wenchao;Liu Xuan;Zhang Yun(Jiangsu Productivity Promotion Center,Nanjing 210042,China)
出处
《南京师范大学学报（工程技术版）》
CAS
2019年第4期1-7,共7页
Journal of Nanjing Normal University(Engineering and Technology Edition)
基金
江苏省科学研究项目(BR2019030)
江苏省生产力促进中心青年人才基金项目(D2019004)
关键词
芯片
电磁骚扰
电磁兼容
检测技术
power chip
electromagnetic interference
EMC
testing technique
