摘要
混合型直流断路器用绝缘栅双极型晶体管(IGBT)器件在应用时不仅要保证其安全可靠,又要充分挖掘其能力,尤其是关断能力。然而,目前关于该应用工况下的IGBT器件特性研究尚不完善,尤其是其大电流下的关断特性,因此需要通过搭建测试平台测试IGBT器件的极限能力,包括极限关断能力、重合闸关断能力等。该文从混合型直流断路器的角度提出一种普遍适用的IGBT器件电气应力测试电路。首先,分析总结不同断路器拓扑和工况下的IGBT器件电气应力共性。基于此,提出新型通用混合型直流断路器用IGBT器件测试电路拓扑,该测试电路在电路参数调节上具有较大的灵活性,能够满足直流断路器各类工况下的不同测试和分析需求,并搭建相应测试平台。进一步地,对测试平台建立考虑寄生参数和特殊部件参数的简化模型,进而分析测试的各个阶段,得到被测IGBT器件电气应力满足的解析式。实验结果验证了测试电路的有效性以及测试电气应力易于调整的特点。该文提出的测试电路拓扑、测试电气应力分析和调整方法能够广泛地应用在断路器用IGBT器件考核和研发测试等方面。
Insulated gate bipolar transistor(IGBT)devices for hybrid Direct Current(DC)circuit breakers must not only ensure their safety and reliability,but also fully exploit their capabilities,especially the turn-off capability.However,the current research on IGBT device characteristic in this application is not perfect,especially the turn-off characteristics with high current.Therefore,it is necessary to test the ultimate capability of IGBT devices through special test platforms,including ultimate turn-off capability,reclosing turn-off capability and so on.This paper proposes an electrical stress test circuit for IGBT devices from the perspective of hybrid DC circuit breakers.Firstly,the electrical stress commonality of IGBT devices under different circuit breaker topologies and operating conditions is analyzed and summarized.Based on this,a new universal test circuit topology of IGBT devices for hybrid DC circuit breakers is proposed.The proposed test circuit has good flexibility in circuit parameter adjustment to meet different tests and analysis requirements of DC circuit breaker under various operating conditions.And then the corresponding test platform is built based on the circuit.Further,a simplified model considering the parasitic parameters and special component parameters is established for the test platform,and then the analytical analysis of the electrical stress of the tested IGBT device is obtained at each phase of the test.The experimental results verify the effectiveness of the test circuit and the highly adjustment of the test electrical stress.The test circuit topology,test electrical stress analysis and adjustment methods proposed in this paper can be widely applied to the evaluation and R&D test of IGBT devices for circuit breakers.
作者
邓二平
应晓亮
张传云
赵志斌
黄永章
Deng Erping;Ying Xiaoliang;Zhang Chuanyun;Zhao Zhibin;Huang Yongzhang(State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources North China Electrical Power University,Beijing 102206,China;Global Energy Interconnection Research Institute Co.Ltd,Beijing 102209,China)
出处
《电工技术学报》
EI
CSCD
北大核心
2020年第2期300-309,共10页
Transactions of China Electrotechnical Society
基金
中央高校基本科研业务费专项资金（2019MS001）
国家重点研发计划（2016YFB0901800）资助项目
