摘要
表面等离激元共振显微镜(Surface Plasmon Resonance microscopy,SPRm)与电位调制的联用可用于分析自组装膜(Self-Assembled Monolayer,SAM)控制下电极表面不同距离的纳米颗粒.对单纳米颗粒的SPRm 图像强度(DC 成分)及对电位的响应(由快速傅里叶变换得到的振幅图像,或AC 成分)进行了检测及分析.结果显示:DC 图像强度与SAM 层的厚度无任何关系,但图像的AC 成分对厚度变化具有较高的灵敏度,这一现象可以用表面阻抗及表面电位与单纳米颗粒和电极之间距离的关系来解释.此方法具有高速、实时、灵敏及免标记等优势,为电极表面单纳米颗粒的电化学过程研究提供了可能.
Surface Plasmon Resonance microscopy (SPRm) is combined with electrical potential modulation to analyze nanoparticles separated from an electrode with different distances controlled with Self-Assembled Monolayer (SAM). We measure and analyze the SPRm image intensity (DC component) and response of the image intensity to the potential (amplitude image from fast Fourier transform,or AC component) of single nanoparticles. The DC image intensity shows little dependence on the thickness of the SAM,but the AC component is highly sensitive to the thickness. We interpret the finding in terms of the surface impedance and dependence of the surface potential on the separation between the nanoparticles and the electrode. This approach allows for fast, real-time, sensitive and label-free measurement of electrochemical processes of single nanoparticles on electrodes.
作者
刘瑞红
王晖
陶农建
Liu Ruihong;Wang Hui;Tao Nongjian(School of Chemistry and Chemical Engineering,Nanjing University,Nanjing,210023,China)
出处
《南京大学学报（自然科学版）》
CAS
CSCD
北大核心
2019年第5期813-818,共6页
Journal of Nanjing University（Natural Science）
基金
国家自然科学基金(21773117,21575062)
关键词
单纳米颗粒
等离激元成像
电位调制
自组装膜
single nanoparticle
plasmonic imaging
potential modulation
self-assembled monolayer
