摘要
基于半导体激光吸收光谱(DLAS)技术,研制了双波长动态液膜厚度与温度高精度同步测量系统。利用标准具对该系统的测量精度进行验证。结果表明,该系统的液膜厚度和温度的平均测量误差分别为4.58%和1.34%。在此基础上,利用该系统对水平石英玻璃板上的液膜蒸发过程进行研究。结果表明,液膜的平均蒸发速率为0.34μm/s,蒸发速率随液膜温度的升高而增大,且DLAS与图像法和热电偶测得的结果吻合良好。利用该系统对流道中的动态液膜进行研究,在不同液膜温度(308,315,323 K)下,液膜平均厚度基本一致且在1 s内波动11次,液膜温度几乎保持恒定。
A simultaneous measurement system based on the diode-laser absorption spectroscopy(DLAS) technique is developed to simultaneously measure the thickness and temperature of a dynamic liquid film with high accuracy.The measurement accuracy of this system is validated by a calibration tool and the results show that the average measurement errors of film thickness and temperature are 4.58% and 1.34%,respectively.On this basis,this system is employed to study the evaporation process of the liquid film on a horizontal quartz glass plate and the results indicate that the average evaporation rate of this liquid film is 0.34 μm/s and the evaporation rate increases with the increase of film temperature.Moreover,the results by DLAS,imaging method and thermocouple are well consistent.In addition,the system is applied to the dynamic liquid film in a flow channel and the results disclose that under different film temperatures of 308,315 and 323 K,the average thicknesses of the liquid film are basically consistent and they fluctuates for 11 times within one second,while the film temperature is almost constant.
作者
杨荟楠
邓豪
蒋永
张月星
苏明旭
Yang Huinan;Deng Hao;Jiang Yong;Zhang Yuexing;Su Mingxu(School of Energy and Power Engineering,University of Shanghai for Science and Technology,Shanghai 200093,China)
出处
《中国激光》
EI
CAS
CSCD
北大核心
2019年第4期208-215,共8页
Chinese Journal of Lasers
基金
国家自然科学基金(51676130
51776129
51306123)
关键词
测量
光谱技术
半导体激光吸收光谱
液膜
厚度
温度
measurement
spectroscopy technique
diode-laser absorption spectroscopy
liquid film
thickness
temperature
