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Enhanced performance of AlGaN-based ultraviolet light-emitting diodes with linearly graded AlGaN inserting layer in electron blocking layer

Enhanced performance of AlGaN-based ultraviolet light-emitting diodes with linearly graded AlGaN inserting layer in electron blocking layer
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摘要 The conventional stationary Al content Al GaN electron blocking layer(EBL) in ultraviolet light-emitting diode(UV LED) is optimized by employing a linearly graded Al Ga N inserting layer which is 2.0 nm Al_(0.3) Ga_(0.7) N/5.0 nm Alx Ga_(1-x) N/8.0 nm Al_(0.3) Ga_(0.7) N with decreasing value of x. The results indicate that the internal quantum efficiency is significantly improved and the efficiency droop is mitigated by using the proposed structure. These improvements are attributed to the increase of the effective barrier height for electrons and the reduction of the effective barrier height for holes,which result in an increased hole injection efficiency and a decreased electron leakage into the p-type region. In addition,the linearly graded AlGaN inserting layer can generate more holes in EBL due to the polarization-induced hole doping and a tunneling effect probably occurs to enhance the hole transportation to the active regions, which will be beneficial to the radiative recombination. The conventional stationary Al content Al GaN electron blocking layer(EBL) in ultraviolet light-emitting diode(UV LED) is optimized by employing a linearly graded Al Ga N inserting layer which is 2.0 nm Al_(0.3) Ga_(0.7) N/5.0 nm Alx Ga_(1-x) N/8.0 nm Al_(0.3) Ga_(0.7) N with decreasing value of x. The results indicate that the internal quantum efficiency is significantly improved and the efficiency droop is mitigated by using the proposed structure. These improvements are attributed to the increase of the effective barrier height for electrons and the reduction of the effective barrier height for holes,which result in an increased hole injection efficiency and a decreased electron leakage into the p-type region. In addition,the linearly graded AlGaN inserting layer can generate more holes in EBL due to the polarization-induced hole doping and a tunneling effect probably occurs to enhance the hole transportation to the active regions, which will be beneficial to the radiative recombination.
作者 Guang Li Lin-Yuan Wang Wei-Dong Song Jian Jiang Xing-Jun Luo Jia-Qi Guo Long-Fei He Kang Zhang Qi-Bao Wu Shu-Ti Li 李光;王林媛;宋伟东;姜健;罗幸君;郭佳琦;贺龙飞;张康;吴启保;李述体(Guangdong Engineering Research Center of Optoelectronic Functional Materials and Devices,Institute of Opto-Electronic Materials and Technology, South China Normal University;Guangdong Institute of Semiconductor Industrial Technology, Guangdong Academy of Sciences;School of Intelligent Manufacture and Equipment, Shenzhen Institute of Information Technology)
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第5期361-365,共5页 中国物理B(英文版)
基金 Project supported by the National Natural Science Foundation of China(Grant Nos.61874161 and 11474105) the Science and Technology Program of Guangdong Province,China(Grant No.2017B010127001) the Science and Technology of Shenzhen City,China(Grant No.GJHZ20180416164721073) the Education Department Funding of Guangdong Province,China(Grant No.2017KZDXM022)
关键词 ULTRAVIOLET LIGHT-EMITTING diode electron blocking LAYER internal quantum efficiency ultraviolet light-emitting diode electron blocking layer internal quantum efficiency
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