摘要
光致衰减是掺硼晶体硅组件的常见现象。通过室内稳态模拟实验和室外自然光暴晒实验,研究了晶体硅组件的初始光致衰减现象,定量化分析了晶体硅组件初始光致衰减达稳定时的总辐照量,探讨了负载方式、通风条件等对晶体硅组件初始光致衰减程度的影响。结果表明,单晶组件的初始光致衰减较多晶组件规律性要好;不同负载方式中,组件开路情况下衰减最小,并网与短路方式下基本一致;通风条件的恶劣会加大组件的初始光致衰减程度。
The light induced degradation is a common phenomenon of the boron doped crystalline silicon module.Through the indoor steady simulation experiment and outdoor natural light exposure experiment,the phenomenon of initial light induced degradation of crystalline silicon module was studied,the total irradiation of the crystal silicon module was quantitatively analyzed when the initial light induced degradation was stable,and the effect of the load mode and ventilation conditions on the initial light induced degradation degree of crystalline silicon module was discussed.The result shows that initial light induced degradation regularity of single crystalline silicon module is better than multi crystalline module;in different load modes,the degradation is the smallest in the case of open circuit of the module;and the grid connection is basically the same as the short circuit.The bad ventilation condition can increase the initial light induced degradation degree of modules.
作者
肖桃云
沈艳萍
张臻
吴晋禄
XIAO Tao-yun;SHEN Yan-ping;ZHANG Zhen;WU Jin-lu(State Key Laboratory of PV Science and Technology, Changzhou Trinasolar Energy Limited Company, Changzhou Jiangsu 213031, China;Hohai University, Changzhou Jiangsu 213022, China)
出处
《电源技术》
CAS
CSCD
北大核心
2017年第12期1729-1732,共4页
Chinese Journal of Power Sources
关键词
光致衰减
辐照量
暴晒
稳态模拟器
light induced degradation
irradiation
exposure
steady-state solar simulator
