摘要
恒定温条件下低重复频率的脉冲试验,是了解GTO特性的一种较为方便的常规方法,已在国内外被广泛采用。但这种脉冲测试的结果与全动态试验结果之间的关系尚未明了,本文作者用数学方法证明了在一定条件下这两种方法作用是相当的。
The pulse measurement of the low frequency is a convenient method which can comprehand the gate Turn off Thyristor characteristics in the constant temperture and it has been widely adopted in the world. Nevertheless, the relationship between the results of pulse measurement and full dynamic is not apparent. In this paper the authours verify by using mathematic method that the function of the two methods is similar under certain conditions.
