摘要
利用现场可编程门阵列（FPGA）并行处理实时性高的特点,在MOSFET故障诊断和保护的应用中,反应时间在1μs以内,能够在充分发挥MOSFET性能的前提下,保护MOSFET免于损坏。根据MOSFET的工作需求,在MATLAB下搭建了Buck电路和灰色预测模型进行仿真实验,基于XILINX公司的System Generator将灰色模型代码转换为Verilog代码进行硬件仿真和实物实验。实际电路中由FPGA通过灰色预测模型快速预测诊断是否会导致故障,确认会导致故障时,则提前控制驱动电路封锁门极驱动信号,在故障发生前快速关断MOSFET。结合3种实验结果可以看出,该模型预测精度高、响应速度快、稳定性强,可应用于实际MOSFET的保护电路,对于其他电力电子器件的预测保护也提供了一种新思路。
Using the characteristics of parallel processing and high real-time performance of FPGA, in the application of MOSFET fault diagnosis and protection, the response time is within 1 μs, and the MOSFET can be protected from damage under the premise of fully exerting the performance of MOSFET. According to the working requirements of MOSFETs, Buck circuit and gray prediction model are built under MATLAB to carry out simulation experiments. Based on XILINX＇s System Generator, the gray model code is converted to Verilog code for hardware simulation and physical experiments. In the actual circuit, the FPGA predicts quickly whether the fault will be caused by the gray prediction model. If the fault is confirmed, the driver circuit is controlled to block the gate drive signal in advance, and the MOSFET is quickly turned off before the fault occurs. Combining the three experimental results, we can see that the model has high prediction accuracy, fast response speed and strong stability, and can be applied to the protection circuit of actual MOSFET. It also provides a new idea for the prediction and protection of other power electronic devices.
作者
刘喜梅
田永康
于木里
Liu Ximei;Tian Yongkang;Yu Muli(College of Automation ＆ Electronic Engineering,Qingdao University of Science ＆ Technology,Qingdao 266000,China)
出处
《电子测量技术》
2018年第18期102-108,共7页
Electronic Measurement Technology
