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基于动态测量的皮秒级上升时间校准方法 被引量:2

Picosecond risetime calibration method based on dynamic metrology
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摘要 为快捷、准确地校准高带宽电子设备的上升时间,提出了一种基于动态测量的皮秒级上升时间校准方法。与根据带宽估计上升时间、使用方和根法修正测得结果的传统方法不同,提出了基于最短区间估计的上升时间计算方法,用以计算标准设备测得波形的上升时间,并使用基于动态测量的有限带宽效应的修正算法对测得上升时间进行修正。在以上研究基础上,给出修正因子列表,可在实际校准中使用查表法,完成对测得上升时间的修正。利用该方法对70 GHz光电探测器和50 GHz取样示波器进行校准,实验结果表明,在被校设备与标准设备带宽可比拟时,提出的方法相比于传统方法,可更准确地获得被测设备上升时间的校准值;与电光取样方法和NTN(nose-to-nose)方法所得的结果进行比较后发现,两者一致性非常好;本方法不需要标准设备与被校设备的实际冲激响应函数,无需进行繁琐的反卷积计算,极大减少了校准耗时,降低了校准难度。 A picosecond risetime calibration method based on dynamic metrology is proposed for fast and accurate calibration of wideband electronic instruments.Differing form traditional method that calculates risetime from bandwidth parameter and corrects the measured risetime using root sum squares method,a risetime calculation algorithm based on minimun interval estimation is proposed for risetime calculation of the waveforms measured by standard device.A correction algorithm for finite-bandwidth effect based on dynamic metrology is also used to correct the measured risetime.Based on the work above,a correction factor list is designed for risetime correction so that the calibration can be conducted using look-up table method during practical calibration.By utilizing this method,a 70 GHz photodiode and a 50 GHz sampling oscilloscope are calibrated.The results show that the proposed method can obtain a more accurate calibration value compared to the traditional method when the bandwidths of the standard device and the device under calibration are commensurate.Compared with the calibration results with electro-optical sampling and Nose-to-Nose method,the calibrated results are consistent.Neither responses of the standard device and the device under calibration nor complex deconvolution calculations is needed so the time consumption and complexity are greatly reduced.
作者 龚鹏伟 姜河 谌贝 谢文 马红梅 Gong Pengwei;Jiang He;Chert Bei;Xie Wen;Ma Hongmei(Beijing Institute of Radio Metrology and Measurement, Beijing 100854, China)
出处 《仪器仪表学报》 EI CAS CSCD 北大核心 2018年第3期215-222,共8页 Chinese Journal of Scientific Instrument
关键词 动态测量 上升时间 反卷积 修正算法 dynamic mctrology risetime deconvolution correction method
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