4Touba N A. Survery of test vector compression teehnique[J]. IEEE Design & Test of Computers, 2006,23(4): 294-303. 被引量：1
5Zhan Wen-fa, Ma Jun, Du Shan-shan, et al. A LFSR Reseeding Scheme Based on Division by 2 to the Power of Integer[J]. In ternational Journal of Digital Content Technology and its Applications,2010,4(9):88-96. 被引量：1
6Zhan Wen-fa, Liang Hua-guo,Jiang Cui yun, et al. A Scheme of Test Data Compression Based on Coding of Even Bits Marking and Selective Output Inversion [J]. Computers and Electrical Engineering, 2010,36 (5) : 969-977. 被引量：1
7Zhan Wen-fa, Liang Hua-guo, Shi Feng, et al. Test data compression scheme based on variable-to>fixed-plus variable-length coding[J]. Journal of Systems Architecture, 2007,53 (11) : 877- 887. 被引量：1
8Chandra A, Chakrabarty K. Test data compression and decom pression based on internal scan chains and Golomb coding[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2002,21 (6): 715-722. 被引量：1
9Chandra A,Chakrabarty K. Test data compression and test resource partitioning for system-on-a-chip using frequency directed run-length(FDR) codes[J]. IEEE Transactions on Computers, 2003,52 (8) : 1076-1088. 被引量：1
10El-Maleh A H. Test data compression for system-on-a-chip using extended frequency-directed run-length code[J]. IET Corn puters & Digital Techniques,2008,2(3) : 155-163. 被引量：1
