摘要
随着半导体技术的飞速发展,芯片集成度和性能显著提高,然而电路的可靠性问题却日益突出,并且成为研究人员和芯片制造厂商广为关注的问题.对于面向航空航天应用的电路芯片,空间辐射导致的单粒子效应是影响其可靠性的主导因素.本文比较系统地分析了现有容忍SEU单粒子效应的锁存器结构工作原理,为相关锁存器结构的研究和比较提供依据.
With the rapid development of semiconductor technology,the chip integration and performance have been improved significantly. However,the reliability of the circuit has become increasingly prominent,which has become the focus of researchers and chip manufacturers. The single particle effect caused by space radiation is the dominant factor affecting the reliability of the circuit chip for aerospace applications. In this paper,the working principle of the latch structure of tolerance SEU single particle effect is analyzed,which provides the reference to the research and comparison of the latch structure.
出处
《白城师范学院学报》
2017年第2期68-72,共5页
Journal of Baicheng Normal University
基金
安徽机电职业技术学院青年教师发展支持计划自然科学研究项目(2015yjzr022)
关键词
单粒子效应
单粒子翻转
单粒子瞬态
锁存器加固
电路可靠性
single particle effect
single particle upset
single particle transient
latch hardening
circuit reliability
