摘要
为验证元器件在空间综合环境特别是真实辐射环境下的可用性,需要开展在轨飞行验证。文中就双极器件和光电器件辐射效应的在轨飞行验证进行了分析,重点分析研究了器件特征参数选择、特征参数测试电路、飞行验证测试系统模块设计等基本思路,并就关键技术难点提出了初步解决建议,为国产元器件飞行验证提供一种参考。
In order to verify the availability of components in space integrated environenvironment,flight verification is necessary. In this paper,the orbit verification of the radiation efoptoelectronic devices is analyzed. The characteristic parameter selection,the characteristic parameter test circuit and theflight verification test system are mainly analyzed and studied. And the preliminary soput for＇ward. This provides a reference for flight verification of domestic components.
出处
《空间电子技术》
2017年第6期33-38,共6页
Space Electronic Technology
关键词
双极器件
光电器件
飞行验证
测试系统
Bipolar device
Optoelectronic device
Flight verification
Test system
