摘要
为实现材料在冲击加载下微观动力学响应测量,基于小型闪光X射线源开展衍射成像系统设计.利用直流X光机及高纯锗探测器实现系统衍射光路的精确调节,克服了闪光X射线瞬时强度高及连续辐射本底强导致的衍射角度确定困难,并采用Scandiflash AB公司TD-450S和成像板建立了衍射成像系统.应用该系统在冲击加载实验中获得了LiF单晶单脉冲的Mo-Kα线静态及动态衍射图像.该闪光X射线衍射系统时间分辨率可达25ns,为冲击压缩实验中材料瞬时结构变化测量提供了新的实验方法.
Flash X-ray diffraction imaging system based on flash X-ray generator(TD-450S of Scandiflash AB)and imaging plate was designed to measure microscopic response in shock wave compression studies.Due to intense Bremsstrahlung radiation,continuous X-ray generator and HPGe detector were used to regulate diffraction optical path.Diffraction signal of LiF single crystal was recorded using flash X-ray tube with molybdenum as the anode material under ambient conditions and shocked state.Results show that flash X-ray diffraction imaging system described here is useful for examining structural changes in shock compression experiments and temporal resolution is 25 ns.
出处
《光子学报》
EI
CAS
CSCD
北大核心
2017年第12期78-82,共5页
Acta Photonica Sinica
基金
强脉冲辐射环境模拟与效应国家重点实验室基金(No.SKLIPR1401Z)资助~~
关键词
X射线衍射
闪光X射线
冲击压缩实验
LiF单晶
微观响应
X-ray Diffractions Flash X-ray
Shock compression experiments
LiF single crystals Microscopic response