摘要
在半导体器件生产企业中,使用测试针接触器件的引脚进行电参数测量,必须考虑两个问题。一个问题是降低测试针与器件引脚间的接触电阻。在自动化生产线中,企业要想得到高精度的测量值,必须经常替换已磨损的测试针,才能获得更高的成品率。另一个问题是降低外部信噪对半导体高频器件(工作频率>2 GHz)HFE参数测量的影响。外部信噪会使高频器件的HFE参数不稳定,造成成品率的降低。通过SOT363测试针设计实例,介绍了新型长寿命抗干扰测试针的设计方法。
During semiconductor test measurements, the contact finger is one of the mAin contributors to high accuracy and precision. Two concerns must be focused to design a good test contact finger. One is good kelvin test contact at test device lead pad, another is test interference from external electrical noise for high frequency （HF） SOT device （〉2 GHz）. To achieve a high precision test measurement in auto mAtic production line, frequent replacement of the worn-out test contact fingers should be performed to sustain good test yield. Another concern is high frequency devices facing HFE test oscillation and causing yield loss. To solve these issues, a new design of long life test contact fingers and high consideration of anti-oscillation/anti-electrical noise design must be developed. In the paper, the new design method of long life span and anti-interference test contact finger is introduced via SOT363 test contact finger.
出处
《电子与封装》
2017年第7期8-10,20,共4页
Electronics & Packaging
关键词
长寿命抗干扰测试针
高频器件
成品率
long-life and anti-interference contact finger
high frequency devices
yield
