摘要
以辐照交联乙烯-四氟乙烯(XETFE)电线的卫星在轨应用为背景,在分析XETFE电线失效机理的基础上,针对电线绝缘包层相对更易失效这一薄弱环节,通过热应力加速寿命试验,对其绝缘老化失效进行了研究。通过可靠性建模和试验数据分析,得到XETFE电线在热应力下的失效加速模型和可靠性信息。结果表明:热应力加速寿命试验对XETFE电线是有效的,能够加速XETFE绝缘老化失效,试验数据与理论加速模型较为符合。
The irradiation cross-linking ethylene-tetrafluoroethylene （XETFE） wire could be widely applied in the satellite in orbit. Through analyzing the failure mechanism of XETFE wire, we found that the insu- lation layer is easier to fail. The XETFE wires were conducted thermal stress accelerated life tests to study their ageing failure mechanism. According to the reliability modeling and test data, the failure accel- eration model and reliability information of XETFE wire under thermal stress were obtained. The results show that the thermal stress accelerated life tests are effective for XETFE wires, which can accelerate the ageing failure of XETFE insulation, and the test data is consitent with the theoretical model.
出处
《绝缘材料》
CAS
北大核心
2017年第7期40-43,共4页
Insulating Materials
