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智能化功率半导体器件漏电流测试仪

Intelligent Measuring Instrument for Detecting Power Semiconductor Device's Leakage Current
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摘要 目前市场上功率半导体器件漏电流测试仪的最高测试电压为3 000 V,10 k V级功率半导体器件已经应用,因此目前的测试设备不能满足应用需要。设计了智能化功率半导体器件漏电流测试仪,可以测试万伏级功率半导体器件的漏电流,采用MK60DN512ZVLL10作为主控芯片,基于迪文触摸屏实现人机交互,通过串行异步方式实现主控制器与触摸屏之间的通讯,触摸屏可以实现测试过程的控制和测试结果的实时显示。试验结果表明,该测试仪很好地实现了高压功率半导体漏电流的准确测试。 The biggest test vohage of power semiconductor device in the market is 3 000 V so far, 10 kV power semiconductor is used, so test equipment of power semiconductor in the market can not meet the need. Intelligent measuring instrument for detecting power semiconductor device's leakage current is designed. The instrument is a real-time test system which is based on MK60DNS12ZVLL10 micro-controller chip and DWIN's touch screen that can realize human computer interaction. The communication between the micro-controller and the touch screen is realized through the serial asynchronous mode. Touch screen can control testing procedure by user and realize test result real-time display. It is indicated that the device can realize the leakage current's test of high-voltage power semiconductor.
出处 《汽车工程师》 2017年第6期54-56,共3页 Automotive Engineer
基金 辽宁省高校重大平台项目(JP2016016)
关键词 漏电流 半导体器件 智能化 触摸屏 高压 Leakage current Semiconductor device Intelligence Touch screen High-voltage
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