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四单元混联系统屏蔽数据的统计分析 被引量:1

Statistical analysis of four-unit hybrid system for masked data
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摘要 推导了四单元混联系统屏蔽数据场合下的似然函数,并且给出了常数失效率单元和线性失效率单元所组成的四单元混联系统屏蔽数据的参数的极大似然估计,以及采用似然比构造区间估计的方法得到参数的近似区间估计. The likelihood function of four-unit hybrid system is deduced based on masked data. The maximum likelihood estimates of parameters are proposed for hybrid system composed of four units with constant failure rate and linear failure rate based on masked data. Besides,the approximate interval estimates of parameters are obtained by using likelihood ratio to construct interval estimate.
出处 《上海师范大学学报(自然科学版)》 2017年第2期178-185,共8页 Journal of Shanghai Normal University(Natural Sciences)
基金 上海市教育委员会科研创新重点项目(14ZZ155)
关键词 屏蔽数据 四单元混联系统 极大似然估计 近似区间估计 masked data four-unit hybrid system maximum likelihood estimate approximate interval estimate
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  • 1LIN DK, USHER JS. Guess FM Exact maximum likelihood estimation using masked system data[J]. IEEE Transactions on Reliability, 1993, 42(4): 631-635. 被引量:1
  • 2SARHAN AM. Estimation of system components reliabilities using masked data[J]. Applied Mathematics and Computation, 2003, 136(1): 79-92. 被引量:1
  • 3SARHAN AM. Reliability estimations of components from masked system life data[J]. Reliability Engineering and System Safety, 2001, 74(1): 107-113. 被引量:1
  • 4SARHAN AM, E1-Gohary AI. Estimations of parameters in pareto reliability model in the presence of masked data[J]. Reliability Engineering and System Safety, 2003, 82(1): 75-83. 被引量:1
  • 5SARHAN AM. Parameter estimations in linear failure rate model using masked data[J]. Applied Mathematics and Computation, 2004, 151(1): 233-249. 被引量:1
  • 6JIANG Hong-yan, ZHANG Guo-fen. Parameter estimation in exponential failure rate model using masked data[J]. Journal of Zhejiang University(Science Edition), 2006, 33(2): 125-128. 被引量:1
  • 7Ammar, M.S. and Awad, I., Estimations of parameters in Pareto reliability model in the presence of masked data, Reliability Engineering & System Safety, 82(2003), 75-83. 被引量:1
  • 8Basu, S., Basu, A.P. and Mukhopadhyay, C., Bayesian analysis for masked system failure data using nonidentical Weibull models, Journal of Statistical Planning and Inference, 78(1999), 255-275. 被引量:1
  • 9Basu, S., Sen, A. and Banerjee, M., Bayesian analysis of competing risks with partially masked cause of failure, Journal of the Royal Statistical Society: Series C (Applied Statistics), 52(2003), 77-93. 被引量:1
  • 10Berger, J.O. and Sun, D., Bayesian analysis for the Poly-Weibull distribution, Journal of the American Statistical Association, 88(1993), 1412-1418. 被引量:1

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