摘要
Doubling is a simple but powerful method of constructing two-level tractional factorial designs with high resolution. This article studies uniformity in terms of Lee discrepancy of double designs. We give some linkages between the uniformity of double design and the aberration case of the original one under different criteria. Furthermore, some analytic linkages between the generalized wordlength pattern of double design and that of the original one are firstly provided here, which extend the existing findings. The lower bound of Lee discrepancy for double designs is also given.
Doubling is a simple but powerful method of constructing two-level tractional factorial designs with high resolution. This article studies uniformity in terms of Lee discrepancy of double designs. We give some linkages between the uniformity of double design and the aberration case of the original one under different criteria. Furthermore, some analytic linkages between the generalized wordlength pattern of double design and that of the original one are firstly provided here, which extend the existing findings. The lower bound of Lee discrepancy for double designs is also given.
基金
supported by NSFC(11271147,11301546,and 11401596)
supported by NSFC(11271147 and 11471136)
the Financially supported by self-determined research funds of CCNU from the colleges basic research and operation of MOE(CCNU16A02012)
