摘要
为了减少复合绝缘子缺陷的故障隐患,研究使用微波反射法对复合绝缘子内部缺陷进行检测的方法。该方法利用微波在绝缘子内部各层交界面的反射特征来进行缺陷检测。采用波阻抗模型进行计算,从理论上验证了微波检测方法的可行性;采用有限积分法对不同厚度的硅橡胶环氧树脂组合样品进行建模仿真,与实验结果对比,得到了硅橡胶厚度与微波反射信号强度的对应关系,即幅度衰减的周期性变化规律;采用平板样品进行实验,研究了缺陷尺寸与检测精度之间的关系,实验中最小可以检测到平板样品内0.3 mm深、4 mm宽的缺陷;提出使用读数偏移量相对值来判断缺陷的方法,使得本微波检测法可以适用于不同型号的绝缘子。理论和实验结果表明,采用微波反射法对复合绝缘子缺陷进行检测具有良好的可行性。
In order to decrease the hidden faults of the composite insulators, a microwave reflection method was applied to inspect the internal defects. The method inspects the defects by using characteristics of the microwave reflections on interfaces of different layers within the insulators. The wave impedance model was adopted to calculate and examine the feasibility of the method theoretically. Then simulation of silicon rubber in different thickness and epoxy resin samples was done by finite integration technique, and the result passed the experimental tests; therefore, the corresponding rela- tionships between the reflection signal intensity and the thickness of the silicon rubber could be provided, which were cyclical variation of the amplitude attenuation. Besides, the relationship between the size of the defects and accuracy of the tests was studied. A minimum of 0.3 mm deep and 4 mm wide defect in the plate shape sample could be recognized in the experiments. The method to determine the defect was proposed, and by using the relative value of offset reading, this microwave detecting method could be applied to different types of insulators. The theoretical and experimental results in- dicate that the microwave reflection method is feasible to be applied on the detection of the defects of the composite insulators.
出处
《高电压技术》
EI
CAS
CSCD
北大核心
2017年第1期203-209,共7页
High Voltage Engineering
基金
国家自然科学基金(51377093)~~
关键词
复合绝缘子
无损检测
微波
缺陷
CST仿真
护套厚度
composite insulator
non-destructive testing
microwave
defects
CST simulation
shed thickness
