期刊文献+

基于集中抄表的静电放电问题的分析与应用 被引量:1

Analysis and Application of the Electrostatic Discharge Problem Based on a Centralized Meter Reading
下载PDF
导出
摘要 按照中华人民共和国电力行业标准(DL-0505—2012),耦合放电应通过8 kV的静电放电测试.本文围绕集中抄表在进行8 kV合放电测试中,集中抄表屏幕直接黑屏这一问题,详细分析了问题的成因,并提出具体解决方案,最终验证方案可行. According to power industry standard of the Peopled Republic of China(YY-0505-2012), Coupling discharge shall adopt 8 kV electrostatic discharge test. This article relates to the coupling discharge test of the centralized meter read-ing during 8 kV,the problem of the centralized meter reading screen appears black. This article specifically analyses the causes of the problems, provides programs to solve the problem in detail. At last, it confirms the feasibility of programs.
出处 《南京师范大学学报(工程技术版)》 CAS 2016年第3期10-15,共6页 Journal of Nanjing Normal University(Engineering and Technology Edition)
基金 江苏省教育厅高校科研成果产业化推进项目(JHB2011-20)
关键词 静电放电 集中抄表 电磁兼容 electrostatic discharge,centralized meter reading,EMC
  • 相关文献

参考文献4

二级参考文献22

  • 1National Standardization Administration Committee of China . GB/T 17626.2-2006 Electromagnetic compatibility .. Testing and measurement techniques-Electrostatic discharge immunity test[S]. Beijing: Standard Press of China, 2006. 被引量:1
  • 2IEC 61000-4-5, Electromagnetic compatibility(EMC)-Part 4-2: Testing and measurement techniques-Electrostatic discharge immunity test[S]. 2008. 被引量:1
  • 3Wang K, Pommerenke D, Chundru R, et al. Numerical modeling of electrostatic discharge generator[J]. IEEE Transactions on Electromagnetic Compatibility, 2003,45(2): 258-271. 被引量:1
  • 4Cwntola F, Pommerenke D, Wang K, et al. ESD excitation model for susceptibility study[C]//IEEE International Symposium on Electromagnetic Compatibility. Istanbuh IEEE, 2003: 58-63. 被引量:1
  • 5Cai Qing, Koo J, Nandy A, et al. Advanced full wave ESD generator model for system level coupling simulation[C]//IEEE International Symposium on Electromagnetic Compatibility. Detroit: IEEE, 2008: 1-6. 被引量:1
  • 6Caniggia S, Maradei F. Circuit and numerical modeling of electrostatic discharge generators[J]. IEEE Transaction on Industry Application, 2006, 42(6): 1350-1357. 被引量:1
  • 7Amoruso V, Helali M, Lattarulo F. An improved model of man for ESD applications[J]. Jounal of Electrostatics, 2000(49): 225. 被引量:1
  • 8Wong S, Hu C, Chan S. SPICE macro model for the simulation of zener diode current-voltage characteristics[J]. IEEE Circuits and Devices Magazine, 1991, 7(4): 9-12. 被引量:1
  • 9Bley M, Filho M, Raizer A. Modeling transient discharge suppressors[J]. IEEEPotentials, 2004, 23(3): 43-45. 被引量:1
  • 10Lou Lifang, Duvvury C, Jahanzeb A, et al. SPICE simulation methodology for system level ESD design[C]//IEEE Electrical Overstress/Electrostatic Discharge Symposium. Nevada: IEEE, 2010: 1-10. 被引量:1

共引文献27

同被引文献2

引证文献1

二级引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部