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正弦脉冲宽度调制条纹结合相位编码条纹的三维测量方法(英文) 被引量:5

3D shape measurement method combining sinusoidal pulse width modulation fringe with phase coding fringe
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摘要 提出了正弦脉宽调制和相位编码结合的一种三维形貌测量方法。这种方法离焦投影编码的两种条纹到被测对象上,使用相移算法,由正弦脉冲宽度调制条纹得到截断相位,由相位编码条纹解码得到条纹级次,从而恢复测量对象的三维形貌。实验结果证明了该方法有两个优点:(1)轻度离焦滤除了谐波从而能降低测量误差;(2)基于相位的编码方式能测量表面反射率不一物体。 A 3D shape measurement method combining sinusoidal pulse width modulation fringe with phase coding fringe was proposed. Two kinds of coding fringes were projected onto the object with defocus. Using a phase-shift algorithm, the wrapped phase was obtained by the sinusoidal pulse width modulation fringe, the fringe order was got by the phase coding fringe. Then, the three-dimensional shape of the measurement object can be restored. The experimental results demonstrate that the proposed method has two merits: (1) It can decrease the measurement error because of filtering the harmonics with slight defocus; (2) It can measure the different contrast object because it is based on phase code.
出处 《红外与激光工程》 EI CSCD 北大核心 2016年第6期171-176,共6页 Infrared and Laser Engineering
基金 国家自然科学基金(51365045,61462063) 航空科学基金(2013ZE56013) 上海航天科技创新基金(SAST2015046)
关键词 三维测量 离焦 正弦脉冲宽度调制条纹 相位编码条纹 3D shape measurement defocusing sinusoidal pulse width modulation fringe phase coding fringe
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  • 1董立菊,于戈.一种有效的图像二值化方法[J].东北大学学报(自然科学版),2004,25(12):1149-1152. 被引量:17
  • 2李永怀,冯其波.光学三维轮廓测量技术进展[J].激光与红外,2005,35(3):143-147. 被引量:26
  • 3张广军,贺俊吉,李秀智.一种新型的微小型构件内表面三维形貌检测系统[J].仪器仪表学报,2006,27(3):302-306. 被引量:8
  • 4FAN K C,SU C D, JONG I. Error analysis for a diffraction grating interferometric stylus probing system[J]. Meas. Sci. Technol. , 2001, 12:482- 490. 被引量:1
  • 5JORDAN H J, WEGNER M, TIZIANI H J. High- ly accurate non-contact characterization of engineer- ing surfaces using confocal microscopy[J]. Meas Sci Technol. 1998,9:1142-1151. 被引量:1
  • 6JONG-AHN KIM, JAE WAN KIM, CHU-SHIK KANG, et al.. Metrological atomic force micro- scope using a large range scanning dual stage[J]. International Journal of Precision Engineering and Manufacturing, 2009,10(5) : 11-7. 被引量:1
  • 7KORPELAINEN V, SEPPA. J,LASSILA A. De- sign and characterization of MIKES metrological a tomic force microscope[J]. Precis. Eng., 2010,doi:10. 1016/ j. precisioneng. 2010. 04. 002. (in press). 被引量:1
  • 8SINCLAIR M B, de BOER M P,CORWIN A D. Long-working-distance incoherent-light interference microscope[J]. Appl. Opt. 2005,44 (36):7715- 7721. 被引量:1
  • 9HELEN H S, KOTHIYAL M P, SIROHI R S. Phase shifting by rotating polarizer in white-light interferometry for surface profling [J]. J. Mod. Opt. , 2000,47(3) :1137-1145. 被引量:1
  • 10YUNJ P,ZHANGLL,XIETB, et al.. Acontact stylus profilometer based on Linnik interference mi- croscope [C]. Key Engineering Materials, 2008, 364-366 Ⅰ:371-376. 被引量:1

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