摘要
本文对四探针法测试薄层材料电阻率的原理进行了论述,重点分析了直线型四探针测量原理,并应用该原理制作了测试装置。利用自制四探针对已知电阻率的ITO导电玻璃基片进行测量,结果表明该装置是精确可靠的。通过将四探针装置与电化学工作站四电极系统相结合对玉米叶片进行测试,计算出叶片电阻率并与传统恒流源产生电压响应的方法进行比较。结果表明:利用四探针测试方法,借助电化学工作站四电极系统可以准确快捷地测定叶片的电阻率,并为进一步研究植物叶片的电特性提供了重要参考。
The principle of testing the resistivity of thin materials with four-point probe method is discussed in this paper,the measurement on the linear four-point probe method is focused,and combining the method,a test device is produced. By using self-made four-point probe,ITO conductive glass substrate is measured,whose resistivity is known,and it confirms that the device is accurate and reliable. Besides,it combines four-point probe device and four-electrode system of electrochemical workstation to test maize leaves,calculate the resistivity of leaves and compare with the results of the traditional voltage response method. The result shows that it is accurate and quick to measure the resistivity of leaves by using the two methods,and it also provides an important reference for the further study on the electrical characteristics of leaves.
出处
《内蒙古农业大学学报（自然科学版）》
CAS
2015年第5期84-89,共6页
Journal of Inner Mongolia Agricultural University(Natural Science Edition)
基金
高等学校博士学科点专项科研基金(20121403110002)
山西省归国留学人员科研基金(2013-061)
关键词
四探针法
玉米叶片
电阻率
Four-point probe method
maize leaves
resistivity
