摘要
红外焦平面探测器的暗电流一般是在零视场(即盲冷屏)条件下进行测试,但这种测试方法必须改变组件结构,只适用于实验室测试。介绍了一种不需要改变组件结构,仅通过基本的性能测试就可以从理论上分析计算得到红外焦平面器件暗电流的方法。对320×256长波探测器组件的试验结果表明,用该方法得到的暗电流结果与用盲冷屏得到的暗电流结果非常接近,可作为红外焦平面探测器暗电流评估的快捷方法。
The dark current of infrared FPA detectors is usually measured in the zero field of view （i.e. the blind cold shield）, but this method can be only used in laboratory because the assembly structure must be changed. A method that the dark current of infrared FPA detectors can be analyzed and computed in theory through basic parameters measurement is presented, which need not change the assembly structure. Experiment for a 320 - 256 LW infrared detector shows that this method gets a similar dark current result compared with the blind shield method, so it can be applied to evaluate the dark current of infrared FPA detectors as a shortcut method.
出处
《红外技术》
CSCD
北大核心
2016年第3期236-238,共3页
Infrared Technology
