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Multi-bit soft error tolerable L1 data cache based on characteristic of data value

Multi-bit soft error tolerable L1 data cache based on characteristic of data value
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摘要 Due to continuous decreasing feature size and increasing device density, on-chip caches have been becoming susceptible to single event upsets, which will result in multi-bit soft errors. The increasing rate of multi-bit errors could result in high risk of data corruption and even application program crashing. Traditionally, L1 D-caches have been protected from soft errors using simple parity to detect errors, and recover errors by reading correct data from L2 cache, which will induce performance penalty. This work proposes to exploit the redundancy based on the characteristic of data values. In the case of a small data value, the replica is stored in the upper half of the word. The replica of a big data value is stored in a dedicated cache line, which will sacrifice some capacity of the data cache. Experiment results show that the reliability of L1 D-cache has been improved by 65% at the cost of 1% in performance. Due to continuous decreasing feature size and increasing device density, on-chip caches have been becoming susceptible to single event upsets, which will result in multi-bit soft errors. The increasing rate of multi-bit errors could result in high risk of data corruption and even application program crashing. Traditionally, L1 D-caches have been protected from soft errors using simple parity to detect errors, and recover errors by reading correct data from L2 cache, which will induce performance penalty. This work proposes to exploit the redundancy based on the characteristic of data values. In the case of a small data value, the replica is stored in the upper half of the word. The replica of a big data value is stored in a dedicated cache line, which will sacrifice some capacity of the data cache. Experiment results show that the reliability of L1 D-cache has been improved by 65% at the cost of 1% in performance.
出处 《Journal of Central South University》 SCIE EI CAS CSCD 2015年第5期1769-1775,共7页 中南大学学报(英文版)
基金 Projects(61472322,61272122)supported by the National Natural Science Foundation of China Project(3102014JSJ0001)supported by the Fundamental Research Funds for the Central Universities,China Project(2013JQ8034)supported by the Natural Science Foundation of Shaanxi Province,China Project(JC20120239)supported by the Basic Research Foundation of NWPU,China
关键词 data cache RELIABILITY REPLICA data value single event upset(SEU) data cache reliability replica data value single event upset (SEU)
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