摘要
在A(寒温)、B(亚湿热)、C(亚湿热)、D(热带海洋)4地的库房内对某型霍尔集成电路开展了为期17年的库房贮存试验,跟踪测试了该型霍尔集成电路的高电平-低电平磁感应强度(工作点)BH-L、低电平-高电平磁感应强度(释放点)BL-H和回差BH等性能参数,并应用T-检验法对4地贮存环境对样品的性能参数的影响进行了分析研究,结果表明各地贮存环境条件对样品的性能参数的影响各不相同。
A 17-year storage test for a Hall IC is carried out in the warehouses of the Hall IC at four places, namely A （cold climate）, B （subtropical climate）, C （subtropical climate） and D （tropical marine climate） . During the test, the BH-L, BL-H and BH of the Hall IC are tracked and tested; and then, the influences of the different storage environments on the above performance parameters are analyzed and studied through T-test. And it turns out that different storage environments will bring different influences for the performance parameters of the test samples.
出处
《电子产品可靠性与环境试验》
2015年第3期31-35,共5页
Electronic Product Reliability and Environmental Testing
