摘要
红外焦平面阵列器件因为制造材料、工艺的影响,难免存在坏元问题,降低了红外图像的质量,影响检测系统的检测概率和虚警率。描述了坏元的特性,分析了其产生机理,利用其特点给出了多帧分析检测坏元的算法。仿真结果表明,该方法简洁可靠,易于实现。最后利用中值滤波法将检测到的坏元进行了补偿。
Infrared focal plane array device inevitably exists bad pixels due to the impact of manufacturing materials, technology and other factors, which may reduce the image quality and affect the detection probability and false alarm rate of the system. In this article, analysis is made to the characteristics of the bad pixels and their generating mechanism. An algorithm for detecting bad pixels by analyzing multiple frames of the image is presented. The simulation results show that this method is simple, reliable, and easy for implementation. Finally, median filter is used to compensate the bad pixels detected.
出处
《电光与控制》
北大核心
2015年第3期69-71,共3页
Electronics Optics & Control
关键词
红外焦平面阵列
坏元检测
坏元补偿
infrared focal plane array
bad pixel detection
bad pixel compensation
