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基于检测能力分析的控制流检测优化方法 被引量:1

Control-Flow Checking Optimization Method Based on Detection Performance Analysis
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摘要 控制流检测是抵抗单粒子效应的有效手段之一。高效的控制流检测方法须实现容错性能和容错开销的合理均衡。首先对控制流标签检测方法的检测性能及影响因素进行建模分析,得到了标签添加的理论基础。然后将一种基于格式化标签的可拓展控制流检测方法 ECCFS做为优化目标算法,并以程序扩展块划分为优化手段,提出一种基于检测能力分析的控制流检测优化方法。该方法给出了容错开销与可靠性提升的工程参考和理论依据,并且实验结果验证了该方法受程序控制流图影响较小,能够实现容错开销与可靠性的合理均衡。 Control flow detection is one of the effective means to resist the single event upset. A method for efficient control flow detection must achieve a reasonable balance between fault-tolerant performance and fault-tolerant overhead. Firstly this paper analyzes the detection performance and the influencing factors of the embedded signature control flow detection methods,and gets theoretical guidance for adding signature. Then control-flow checking optimization method based on the analysis of detection performance is put forward in which ECCFS is used as the optimization target algorithm and the extend block method is introduced. The method proposes a theory of the balance between arithmetic overload and reliability improvement,and experimental results shows that the method is less affected by the program control flow graph,and achieves a reasonable balance between fault-tolerant overhead and reliability.
机构地区 信息工程大学
出处 《信息工程大学学报》 2015年第1期30-34,40,共6页 Journal of Information Engineering University
基金 国家863计划资助项目(2012AA01A502)
关键词 控制流检测 扩展块 标签检测 软件容错 故障注入 ontrol flow checking extend block embedded signature software fault tolerance fault injection
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  • 1高星,廖明宏,吴翔虎,黄振远.基于虚拟寄存器的控制流错误检测算法[J].宇航学报,2007,28(1):183-187. 被引量:4
  • 2傅忠传,陈红松,崔刚,杨孝宗.处理器容错技术研究与展望[J].计算机研究与发展,2007,44(1):154-160. 被引量:36
  • 3朱文明.卫星辐射环境与加固技术飞行验证监测.卫星抗辐射加固技术学术交流文集[M].北京:中国空间技术研究院,1995.1-10. 被引量:2
  • 4隋厚堂.单粒子动态监测仪和部分数据处理结果.空间探测专业第十次学术会议论文集[M].福建,1997.131-134. 被引量:1
  • 5隋厚堂.系统(16,8)码的错误分布和性能比较.空间探测专业第七次学术会议论文集[M].浙江,1994.265-268. 被引量:1
  • 6Baumann R C. Radiation-induced soft errors in advanced semiconductor technologies[J]. IEEE Trans on Device and Materials Reliability, 2005, 5(3): 305-316. 被引量:1
  • 7Ziegler J F, Puehner H. SER-History, Trends, and Challenges: A Guide for Designing with Memory ICs [M]. San Jose, CA: Cypress Semiconductor Corp, 2004. 被引量:1
  • 8Shivakumar P, Kistler M, et al. Modeling the effect of technology trends on the soft error rate of combinational logic [C]//Proc of the 32nd Int Conf on Dependable Systems and NeCworks. Los Alamitos, CA.. IEEE Computer Society, 2002 : 389-399. 被引量:1
  • 9Saurabh B, Balaji S, et al. Hierarchical error detection in a software implemented fault tolerance (SIFT) environment [J]. IEEE Trans on Knowledge and Data Engineering, 2000, 12(2): 203-224. 被引量:1
  • 10Mahmood A, MeCluskey E J. Concurrent error detection using watchdog processors A survey [J]. IEEE Trans on Computers, 1988, 37(2): 160-174. 被引量:1

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