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单脉冲激光辐照CCD探测器热效应仿真研究 被引量:6

Thermal effect simulation of CCD detector under single-laser-pulse irradiation
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摘要 为了研究实际情况下激光辐照CCD热效应情况,首先介绍了CCD探测器的结构和工作原理并分析了脉冲激光对CCD探测器的热损伤过程。然后利用有限元方法在三维空间上分别对三种波长的脉冲激光(532nm、808nm、1064nm)辐照CCD进行了固体传热仿真,通过仿真得到了在三种不同波长下CCD探测器的损伤能量密度阈值。接下来通过比较损伤能量密度阈值发现当波长为532nm时,CCD探测器的损伤能量密度阈值最小。最后对比已发表的实验结果找到了比较统一的损伤规律。 Research work has been expanded to study thermal effect of CCD detector under laser irradiation in the actual situation. At first, the process during pulsed laser damaged CCD detector was analyzed from the aspect of ther_mal effect, and CCD detector’ s structure and working principle were introduced. Then three-dimensional solid heat transfer simulation model was built in the case of three different kinds of laser wavelength ( 532 nm、808 nm、1064 nm ) with Finite Element Method, and damage power density thresholds of CCD detector in the case of different laser wave_lengths were gotten. Next it is found that when laser wavelength was 532nm, damage power density threshold of CCD detector was minimum in the case of three different kinds of laser wavelength. Finally the conclusion is summarized as following:when the wavelength of laser is 532nm, pulse laser is more likely to cause thermal damage to the CCD de_tector in the case that lasers’ s power are same.
出处 《激光杂志》 CAS CSCD 北大核心 2014年第12期78-81,共4页 Laser Journal
基金 北京市教育委员会科技计划面上项目(KM201311232006)
关键词 激光对CCD探测器的热损伤 损伤能量密度阈值 有限元方法 CCD探测器 仿真 laser thermal damage CCD detector damage power density threshold Finite Element Method CCD detector simulation
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