摘要
设计了一种基于微控制器的RadFET辐射剂量测试系统,介绍了系统的测试原理和方法,通过测量阈值电压的偏移值可得到吸收剂量。利用60 Coγ辐照测试系统进行了试验验证。试验结果表明:该测试系统能够实现宽范围辐射剂量测量,同时该系统也可用于其他MOSFET器件阈值电压的测量,尤其适用于辐射剂量的长期测量或者实时测量。
A microcontroller-hased RadFET radiation dosimeter is space radiation. Principles and methods of dosimeter are described proposed for measuring The absorbed radiation doses of the MOSFETs are obtained by measuring the threshold voltage shift of the Rad FET, and the system is irradiated by ^60 Co-γ rays. The experiment results show that the system can be used for threshold voltage measurement with other types of MOSFETs, especially in long duration experiments, as well as for real-time measurement in radiotherapy.
出处
《现代应用物理》
2014年第4期256-259,共4页
Modern Applied Physics
基金
真空低温技术与物理重点实验室基金资助项目(9140C550209120C55)
