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BGA封装FPGA焊点失效故障诊断系统设计 被引量:2

Design of Detecting System of Solder joint Faults of BGA Package FPGA
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摘要 针对BGA(Ball Grid Array)封装FPGA(Field Programmable Gate Array)焊接点连接失效的故障诊断问题,提出了一种故障检测系统设计方案;该方案分别从焊点级、芯片级和系统级故障诊断3个层次构建故障检测系统;方案基于Altera公司的DE2硬件平台构建单个焊点健康信息提取IP核;针对芯片焊点众多,难以全部监控的问题采用Canary故障检测法监测4个角落的敏感焊点的健康信息;敏感焊点的健康信息经菊花链式通信链路实现了不同FPGA芯片之间的信息互联,完成整个系统的焊点健康信息整合。 Aim at detecting Ball Grid Array (BGA) solder-joint faults of FPGA, this paper proposed a design solution of malfunction detecting system. This system consist of solder-joint-level, core-level and systematic-level malfunction detecting. Based on the Alter DE2 hardware platform to design the IP core of solder joint detecting, detecting the sensitive solder-joints through the ways of Canary to solve the difficulty of all-solder-joints detecting. Make all the FPGA's in daisy chain for congregate their health information.
出处 《计算机测量与控制》 北大核心 2014年第9期2722-2725,共4页 Computer Measurement &Control
关键词 BGA封装 焊点故障 故障检测系统 CANARY 菊花链 BGA solder-joint faults malfunction detecting system Canary daisy chain
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  • 1Heinrich SM, Shakya S , Lee P S. An analytical model developedfor predicting the time - dependent shearing [J]. Journal of Elec-tronic Packaging, 2000,122 (4) ; 328 -334. 被引量:1
  • 2James P. Hofmeister, Justin B. Judkins, Douglas Goodman. Alow - power sensor design,SJ monitor, for monitoring 24x7 thehealth of BGA solder joints [A]. IEEE Aerospace Conference 2008[C]. Big Sky, MT, Mar. 1 -8, 2008’ 1-9. 被引量:1
  • 3James P. Hofmeister, Terry A. Tracy, Pradeep Lall. Ball GridArray (BGA) Solder Joint Intermittency Detection: SJ BIST [A].IEEE Aerospace Conference [C]. 2008. 被引量:1
  • 4James P. Hofmeister, Pradeep Lall, Edgar Ortiz, et al. Real -Time Detection of Solder - Joint Faults in Operational Field Pro-grammable Gate Arrays [A]. IEEE Aerospace Conference 2007[C], Big Sky, MT, Mar. 4-9,2007,Track 11 -0908. 1 -9. 被引量:1
  • 5Hofmeister J P, Lall P, Goodman D,et al. Intermittency Detec-tion and Mitigation in Ball Grid Array (BGA) Packages [A].IEEE AUTOTESTCON 2007 [C]. Baltimore, MD, Sep. 17-21 , 2007. 40 -49. 被引量:1
  • 6Pecht M, Tuchband B,Vichare N,et al. Prognostics and HealthMonitoring of Electronics [A]. International Conference on Elec-tronic Materials and Packaging [C]. 2006. 被引量:1
  • 7Altera. Virtual JTAG (sld _ virtual _ jtag) megafunction user guide[Z/OL]. www.altera.com,2008. 被引量:1
  • 8IEEE Std 1149. 1 - 2001, IEEE Standard Test Access Port andBoundary2Scan Architecture [S]. New York,USA,2001. 被引量:1
  • 9黄锋,王建业.FPGA焊点网络失效的在线测试[J].化工自动化及仪表,2012,39(8):1062-1065. 被引量:2
  • 10温熙森等著..智能机内测试理论与应用[M].北京:国防工业出版社,2002:217.

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