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新原理光电探测阵列的微光响应测试研究 被引量:2

Test study on weak-light level response for new quantum effect photo-detector array
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摘要 针对暗电流低、灵敏度高等优点的新原理量子效应光电探测器,设计和加工了增益可调CTIA读出电路,以获得宽动态范围读出。读出电路芯片与1×64元量子效应光电探测器集成封装,在室温(300K)条件下进行读出测试研究。光源采用633nmHe-Ne激光器,直径50μm光斑聚焦照射。测试结果表明:器件偏压为-0.1V,激光功率150pW,积分时间78μs,响应电压55mV,电压响应率达到3.67E+08V/W。根据测试结果,提出了进一步降低暗电流影响的改进测试方案。 For new quantum effects photo-detector array which has small dark current and high sensitivity, a gain adjustable readout circuit based on CTIA structure and sampling and holding circuit with correlated double sampling (CDS) technique was designed and fabricated in order to obtain a application of wide dynamic range. The 633 nm laser beam with radiation intensity tunable which is calibrated by a power meter shoots on the photo-detector cell one by one with a 50 m diameter facula. The test results show that the readout response voltage can reach to 55 mV and responsivity 3.67E+08VAV when biased voltage up to -3 V and radiation intensity 150 pW at 300 K and integration time 78 txs. The test system is improved to reduce dark current further.
出处 《红外与激光工程》 EI CSCD 北大核心 2014年第8期2546-2551,共6页 Infrared and Laser Engineering
基金 国家科技部重大科研项目(2006CB932802 2011CB932903) 上海市科委配套(078014194 118014546)
关键词 微光读出 量子效应器件 高灵敏度 增益可调读出电路 暗电流 weak-light readout quantum effect photo-detector high sensitivity gain adjustable readout circuit dark current
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